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IEEE design & test : D & T

New York, NY : IEEE 2013 -

ZDB-ID

2714080-5  

Title

IEEE design & test : D & T

Published

New York, NY : IEEE

Publication history

30.2013 -

Notes

Online-Ressource

Gesehen am 03.05.17

Other editions

Erscheint auch als Druck-Ausgabe:  Institute of Electrical and Electronics Engineers: IEEE design & test  (ISSN: 2168-2356) 

Standard numbers

Linking ISSN: 2168-2356

ISSN: 2168-2364

OCLC number: 846959366

Subject indexing
Manifestation

journal

Language
Country of publication
Media type

available online

Frequency

bimonthly

IDN

1034034839

Last Change

12-02-25

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IEEE design & test

New York, NY : IEEE 2013 -

ZDB-ID

2729075-X  

Title

IEEE design & test

Published

New York, NY : IEEE

Publication history

30.2013 -

Other editions

Erscheint auch als Online-Ausgabe:  Institute of Electrical and Electronics Engineers: IEEE design & test  (ISSN: 2168-2364) 

Standard numbers

ISSN: 2168-2356

OCLC number: 830510755

Subject indexing

DDC subject groups: 004 Data processing & computer science 

German subject headings:
Datenverarbeitungssystem ; Leistungsbewertung
Computer ; Entwurf
Manifestation

journal

Language
Country of publication
Media type

Print

Frequency

bimonthly

IDN

103822215X

Last Change

08-04-19

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