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2729075-X
IEEE design & test
Institute of Electrical and Electronics Engineers
New York, NY : IEEE
30.2013 -
Predecessor: Institute of Electrical and Electronics Engineers: IEEE design & test of computers
Erscheint auch als Online-Ausgabe: Institute of Electrical and Electronics Engineers: IEEE design & test (ISSN: 2168-2364)
ISSN: 2168-2356
OCLC number: 830510755
DDC subject groups: 004 Data processing & computer science
journal
English
United States, USA
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08-04-19